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Deposition & Etch Metrology Wet Process Wafer Process
HRT 3000 Optical Profiler
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The HRT 3000 is real time, optical, and noncontact. It measures various surface topographies and reflectivities, and easily

addresses sharp steps and geometries up to 2000 microns in Z height. The Optical Stylus technology is based on a single

point confocal technique and has no moving parts.

The HRT 3000 is available as a standalone metrology system or in OEM modules. Application specific solutions are available. Inquire regarding your application today

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• Patented live video shows inspection location and simplifies set-up

• Large measurement range from 0.100’s to 1000um’s

• Large dynamic range accommodate mirror surfaces or low reflection substrates

• Measurement modes include static, scan profile, and area scan

• Measurement results displayed real-time

• Standard calculations can be applied to results

• Includes Tamar’s vision metrology for X/Y measurements

• Recipes can be ran for automatic operation

• Optical flat stage available as option

• HRT 3000 modules can run on TamarWaferScan platform

• Best ROI

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